IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multitone load-pull characterization system for power and distortion analysis of microwave transistors

Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements

Author(s): Hajji, R. ; Beauregard, F. ; Ghannouchi, F.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Braunschweig, Germany, Germany
Conference Date: 17 June 1996
Page(s): 538 - 539
ISBN (Paper): 0-7803-3376-4
DOI: 10.1109/CPEM.1996.547337
Regular:

This paper presents a new load-pull measurement system for transistor characterization under N tone excitation signal where N/spl ges/2. The new set up uses an arbitrary wave generator (AWG) to... View More

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