IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fully automated system for the characterization of standard reference resistors using the quantum Hall effect

Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements

Author(s): Good, J.A. ; Allitt, M.L. ; Owczarkowski, M. ; Probst, P.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Braunschweig, Germany, Germany
Conference Date: 17 June 1996
ISBN (Paper): 0-7803-3376-4
DOI: 10.1109/CPEM.1996.547058
Regular:

The authors have constructed a self-contained, fully automatic system for the characterization of laboratory transfer resistance standards. A novel feature is the integration of all elements into... View More

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