IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fighting arcing and field emission in medical X-ray tubes

Proceedings of 17th International Symposium on Discharges and Electrical Insulation in Vacuum

Author(s): Koch, L. ; Lesche, A. ; Maring, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Berkeley, CA, USA, USA
Conference Date: 21 July 1996
Volume: 2
ISBN (Paper): 0-7803-2906-6
DOI: 10.1109/DEIV.1996.545531
Regular:

Vacuum breakdown induced by field emission is limiting the performance of modern X-ray tubes. To reduce the probability of arcing, a combination of design and controlled production processes such... View More

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