IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise measurements of vacuum arc cathode spot lifetime

Proceedings of 17th International Symposium on Discharges and Electrical Insulation in Vacuum

Author(s): Bochkarev, M.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Berkeley, CA, USA, USA
Conference Date: 21 July 1996
Volume: 1
ISBN (Paper): 0-7803-2906-6
DOI: 10.1109/DEIV.1996.545339
Regular:

In a number of studies it has been shown that the gap voltage fluctuations are related to the cathode processes (birth and death of cathode spots). Therefore, it seemed purposeful to perform a... View More

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