IEEE - Institute of Electrical and Electronics Engineers, Inc. - Control of application specific interconnection on gate arrays using an active checkerboard test structure

Proceedings of International Conference on Microelectronic Test Structures

Author(s): Hess, C. ; Weiland, L.H. ; Lau, G. ; Simoncit, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Trento, Italy, Italy
Conference Date: 25 March 1996
Page(s): 55 - 60
ISBN (Paper): 0-7803-2783-7
DOI: 10.1109/ICMTS.1996.585568
Advertisement