IEEE - Institute of Electrical and Electronics Engineers, Inc. - A parallel precorrected FFT based capacitance extraction program for signal integrity analysis

Proceedings of 33rd Design Automation Conference

Author(s): Aluru, N.R. ; Nadkarni, V.B. ; White, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 3 June 1996
Page(s): 363 - 366
ISBN (Paper): 0-7803-3294-6
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.1996.545602
Regular:

In order to optimize interconnect to avoid signal integrity problems, very fast and accurate 3-D capacitance extraction is essential. Fast algorithms, such as the multipole or precorrected Fast... View More

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