IEEE - Institute of Electrical and Electronics Engineers, Inc. - Requirements based system level risk modeling

Annual Reliability and Maintainability Symposium. 2004 Proceedings

Author(s): L. Meshkat ; S. Cornford ; M. Feather
Sponsor(s): IEEE Reliability Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 26 January 2004
Page Count: 7
Page(s): 500 - 506
ISBN (Paper): 0-7803-8215-3
DOI: 10.1109/RAMS.2004.1285497
Regular:

Space exploration missions are often characterized by multiple phases and each phase in turn satisfies some objective or requirement. The success of the mission is measured by the degree to which... View More

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