IEEE - Institute of Electrical and Electronics Engineers, Inc. - Minimal cut set/sequence generation for dynamic fault trees

Annual Reliability and Maintainability Symposium. 2004 Proceedings

Author(s): Zhihua Tang ; J.B. Dugan
Sponsor(s): IEEE Reliability Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 26 January 2004
Page Count: 7
Page(s): 207 - 213
ISBN (Paper): 0-7803-8215-3
DOI: 10.1109/RAMS.2004.1285449
Regular:

This paper proposes a zero-suppressed binary decision diagrams (ZBDD) based solution for minimal cut set/sequence (MCS) generation of dynamic fault trees. ZBDD is an efficient data structure for... View More

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