IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nonparametric estimation of marginal failure distributions from dually censored automotive data

Annual Reliability and Maintainability Symposium. 2004 Proceedings

Author(s): V. Krivtsov ; M. Frankstein
Sponsor(s): IEEE Reliability Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2004
Conference Location: Los Angeles, CA, USA, USA
Conference Date: 26 January 2004
Page Count: 4
Page(s): 86 - 89
ISBN (Paper): 0-7803-8215-3
DOI: 10.1109/RAMS.2004.1285428
Regular:

It is not uncommon that a component's reliability characteristics depend on two usage variables. As an example, for automotive components such variables are time in service and accumulated... View More

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