IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhanced low dose rate sensitivity (ELDRS) observed in RADFET sensor
Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.
|Author(s):||S.J. Kim ; J. Seon ; K.W. Min ; Y.H. Shin ; W. Choe|
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 January 2003|
|Conference Location:||Noordwijk, The Netherlands, The Netherlands|
|Conference Date:||15 September 2003|
|Page(s):||669 - 671|