IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single event effects characterization of 16K x 9 fifo

Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.

Author(s): R. Marec ; P. Ribeiro ; L. Cresciucci ; C. Barillot ; C. Chatty ; P. Calvel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Noordwijk, The Netherlands, The Netherlands
Conference Date: 15 September 2003
Page Count: 4
Page(s): 269 - 272
ISBN (Paper): 92-9092-846-8
ISSN (Paper): 0379-6566
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