IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single event effects characterization of 16K x 9 fifo
Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.
|Author(s):||R. Marec ; P. Ribeiro ; L. Cresciucci ; C. Barillot ; C. Chatty ; P. Calvel|
|Publisher:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||1 January 2003|
|Conference Location:||Noordwijk, The Netherlands, The Netherlands|
|Conference Date:||15 September 2003|
|Page(s):||269 - 272|