IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems

Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.

Author(s): F. Miller ; A. Germain ; N. Board ; R. Gaillard ; P. Poirot ; C. Chatry ; T. Carriere ; R. Dufayel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Noordwijk, The Netherlands, The Netherlands
Conference Date: 15 September 2003
Page Count: 11
Page(s): 199 - 209
ISBN (Paper): 92-9092-846-8
ISSN (Paper): 0379-6566
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