IEEE - Institute of Electrical and Electronics Engineers, Inc. - Emission measurements of microcontrollers

2003 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): T. Steinecke
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Istanbul, Turkey
Conference Date: 11 May 2003
Volume: 1
Page Count: 3
ISBN (Paper): 0-7803-7779-6
DOI: 10.1109/ICSMC2.2003.1428203
Regular:

The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic... View More

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