IEEE - Institute of Electrical and Electronics Engineers, Inc. - Workers' attention control in program check for NC manufacturing

SICE 2003 Annual Conference

Author(s): K. Nomoto ; K. Shima ; M. Wakamatsu ; Y. Shimizu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
Page(s): 1,065 - 1,068
ISBN (Paper): 0-7803-8352-4
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