IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determining the depth measurement for the 3D model reconstruction

SICE 2003 Annual Conference

Author(s): M.M. Sein ; Y. Arakawa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
Page(s): 886 - 889
ISBN (Paper): 0-7803-8352-4
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