IEEE - Institute of Electrical and Electronics Engineers, Inc. - Crystallization measurement using quartz crystal analyzer

SICE 2003 Annual Conference

Author(s): Byung Chul Kim ; Young Han Kim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
Page(s): 793 - 796
ISBN (Paper): 0-7803-8352-4
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