IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of forest damage by harmful insects on Mt. Kariyasu

SICE 2003 Annual Conference

Author(s): R. Komura ; M. Kubo ; N. Kamata ; K. Muramoto
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-8352-4
Regular:

This paper presents the analysis of forest damaged by harmful insects using remote sensing. In 1997, forest damage caused by insects around Mt. Kariyasu was found. The damaged area was analyzed... View More

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