IEEE - Institute of Electrical and Electronics Engineers, Inc. - Foreign material evaluation equipment: collecting method

SICE 2003 Annual Conference

Author(s): K. Kuratani ; T. Fujii ; M. Tanaka ; A. Daito ; T. Murosaki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-8352-4
Regular:

In injector manufacturing, mixed defectives are incurred by foreign materials. We developed a foreign material evaluation equipment to show the specification of foreign material reduction and... View More

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