IEEE - Institute of Electrical and Electronics Engineers, Inc. - Foreign material evaluation equipment: measurement method

SICE 2003 Annual Conference

Author(s): A. Daito ; T. Murosaki ; H. Ito ; K. Kuratani ; T. Fujii
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 4
ISBN (Paper): 0-7803-8352-4
Regular:

In injector manufacturing, mixed defectives are occurred by the foreign material of burrs, cellulose and so on. Then, we developed a foreign material evaluation equipment to show the specification... View More

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