IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of coating thickness non-uniformity of photosensitive film in production process

SICE 2003 Annual Conference

Author(s): N. Inoue ; N. Aoshima
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Fukui, Japan, Japan
Conference Date: 4 August 2003
Volume: 1
Page Count: 5
ISBN (Paper): 0-7803-8352-4
Regular:

In photo material industry, the check of quality about surface of photosensitive layer is very important. If there is uneven thickness failure in photo layer, it may cause a shadow or a stripe. In... View More

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