IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic test allocation model for software reliability

Proceedings. Third International Conference on Quality Software

Author(s): S.A. Al-Maati ; K. Rekab
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Dallas, TX, USA, USA
Conference Date: 7 November 2003
Page Count: 6
Page(s): 26 - 31
ISBN (Paper): 0-7695-2015-4
DOI: 10.1109/QSIC.2003.1319082
Regular:

In any non trivial software system the reliability of the software cannot be determined exactly. Instead, we must apply statistical methods to create an estimate based on a sample of test cases.... View More

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