IEEE - Institute of Electrical and Electronics Engineers, Inc. - Control and measurement of the carrier-envelope phase of an ultrafast Ti:sapphire laser-amplifier system

2003 Conference on Lasers and Electro-Optics Europe (CLEO/Europe 2003)

Author(s): R.Th. Zinkstok ; S. Witte ; W. Hogervoist ; K.S.E. Eikema
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Munich, Germany, Germany
Conference Date: 22 June 2003
Page Count: 1
Page(s): 445
ISBN (Paper): 0-7803-7734-6
DOI: 10.1109/CLEOE.2003.1313508
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