IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of the diffusion length in polycrystalline silicon by surface photovoltage technique

3rd World Conference on Photovoltaic Energy Conversion

Author(s): V. Svrcek ; A. Focsa ; A. Slaoui ; J.C. Muller ; I. Pelant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Osaka, Japan
Conference Date: 11 May 2003
Volume: 2
Page Count: 4
ISBN (Paper): 4-9901816-0-3
Regular:

The Surface Photovoltage (SPV) technique in a expanded spectral region is applied to study perpendicular transport properties in fine (fg/spl sim/1-5 /spl mu/m) and large grained (lg/spl sim/1-3... View More

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