IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical mismatch in double AR coated c-Si, a simple theoretical and experimental correlation

3rd World Conference on Photovoltaic Energy Conversion

Author(s): J. Aguilar ; Y. Matsumoto ; G. Romero ; M.A. Reyes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Osaka, Japan
Conference Date: 11 May 2003
Volume: 2
Page Count: 4
ISBN (Paper): 4-9901816-0-3
Regular:

Theoretical optimization of ARC (antireflecting coating) for both, single and double ARC has been done in the order to obtain minimum reflectance on crystalline silicon surface. Experimental... View More

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