IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of weathered c-Si PV modules

3rd World Conference on Photovoltaic Energy Conversion

Author(s): D. Chianese ; A. Realini ; N. Cereghetti ; As. Rezzonico ; E. Bura ; G. Friesen ; A. Bernasconi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Osaka, Japan
Conference Date: 11 May 2003
Volume: 3
Page Count: 5
ISBN (Paper): 4-9901816-0-3
Regular:

The LEEE-TISO testing centre for PV components has, since 1991, carried out systematic tests, under real operating conditions, on the most important modules currently on the market. PV c-Si... View More

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