IEEE - Institute of Electrical and Electronics Engineers, Inc. - Initial drop in I/sub sc/ of the field test c-Si PV modules in Japan

3rd World Conference on Photovoltaic Energy Conversion

Author(s): Y. Hishikawa ; K. Morita
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Osaka, Japan
Conference Date: 11 May 2003
Volume: 3
Page Count: 5
ISBN (Paper): 4-9901816-0-3
Regular:

Stability of photovoltaic (PV) modules has been investigated, based on about 2400 field test PV modules manufactured in 1990's, which show better reliability than the earlier generation modules.... View More

Advertisement