IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimization of test/diagnosis/rework location(s) and characteristics in electronic systems assembly using real-coded genetic algorithms

Proceedings. International Test Conference 2003

Author(s): Zhen Shi ; P. Sandborn
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Charlotte, NC, USA, USA
Conference Date: 30 September 2003
Volume: 1
Page Count: 10
Page(s): 937 - 946
ISBN (Paper): 0-7803-8106-8
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2003.1271080
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