IEEE - Institute of Electrical and Electronics Engineers, Inc. - Closed-loop performance measures for flight controllers subject to neutron-induced upsets

42nd IEEE International Conference on Decision and Control

Author(s): W.S. Gray ; Hong Zhang ; O.R. Gonzalez
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 3
Page Count: 6
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272990
Regular:

It has been observed that atmospheric neutrons can produce single event upsets in digital flight control hardware. The phenomenon has been studied extensively at the chip level, and now system... View More

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