IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sampling random transfer functions

42nd IEEE International Conference on Decision and Control

Author(s): C.M. Lagoa ; X. Li ; M.C. Mazzaro ; M. Sznaier
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 3
Page Count: 7
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272984
Regular:

Recently, considerable attention has been paid to the use of probabilistic algorithms for analysis and design of robust control systems. However, since these algorithms require the generation of... View More

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