IEEE - Institute of Electrical and Electronics Engineers, Inc. - The intersection of controls and physics in atomic force microscopy

42nd IEEE International Conference on Decision and Control

Author(s): J.P. Cleveland
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 3
Page Count: 3
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272931
Regular:

This paper points out some of the areas in atomic force microscopes where control can make big contributions. There are lots of interesting problems to be found, and given that there are several... View More

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