IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault detection in a mixed H/sub 2//H/sub /spl infin// setting

42nd IEEE International Conference on Decision and Control

Author(s): M.-J. Khosrowjerdi ; R. Nikoukhah ; N. Safari-Shad
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 2
Page Count: 6
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272817
Regular:

In this paper, we study the problem of fault detection in linear time-invariant systems, which contain two types of inputs: inputs with fixed and known spectral densities and inputs with bounded... View More

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