IEEE - Institute of Electrical and Electronics Engineers, Inc. - Threshold calculation using LMI-technique and its integration in the design of fault detection systems

42nd IEEE International Conference on Decision and Control

Author(s): S.X. Ding ; P. Zhang ; P.M. Frank ; E.L. Ding
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 1
Page Count: 6
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272607
Regular:

In this paper, problems related to the threshold calculation and its integration in the design of observer-based fault detection systems are studied. The focus of the study is the application of... View More

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