IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Cramer-Rao type lower bound for the estimation error of systems with measurement faults

42nd IEEE International Conference on Decision and Control

Author(s): I. Rapoport ; Y. Oshman
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 5
Page Count: 6
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1272366
Regular:

A Cramer-Rao type lower bound for a class of systems with faulty measurements is presented. Lower bounds for both the state and the Markovian interruption variables of the system are derived,... View More

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