IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust control approach to atomic force microscopy

42nd IEEE International Conference on Decision and Control

Author(s): A. Sebastian ; M.V. Salapaka ; J.P. Cleveland
Sponsor(s): Honeywell Lab.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2003
Conference Location: Maui, HI, USA
Conference Date: 9 December 2003
Volume: 4
Page Count: 3
ISBN (Paper): 0-7803-7924-1
ISSN (Paper): 0191-2216
DOI: 10.1109/CDC.2003.1271677
Regular:

The imaging problem using an atomic force microscope (AFM) is addressed in the framework of modern robust control. Subsequently stacked /spl Hscr//sub /spl infin// and Glover McFarlane controllers... View More

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