IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of soft-threshold wavelet de-noising method in the diagnosis of transformer during impulse test

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): Fu Chenzhao ; Liu Jian ; Li Yanming ; Liu Jie ; Wang Guogang
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 4
Page(s): 845 - 848
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973810

In this paper, neutral point current data during transformer impulse tests are analyzed by soft-threshold shrinkage de-noising method based on wavelet frame. Simulation tests are made to verify... View More