IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of development of electrical trees in insulators using local fractal dimension

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): M. Fujii ; T. Iwase ; H. Ihori ; K. Arii
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 4
Page(s): 615 - 618
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973745
Regular:

Patterns of electrical trees in insulators are estimated numerically by fractal dimension. However they are not simple fractal but multifractal. They can be estimated by global spectrum and... View More

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