IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluation of residual lifetime of LDPE degraded radiation by time-temperature superposition method

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): Kj-Yup Kim ; Chung Lee ; Boo-Hyung Ryu ; Kee-Joe Lim
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 4
Page(s): 130 - 133
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973584
Regular:

A novel method has been proposed to determine the residual lifetime of low density polyethylene (LDPE) by time-temperature superposition (TTS) using a dynamic mechanical analyzer (DMA). The... View More

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