IEEE - Institute of Electrical and Electronics Engineers, Inc. - Applying study on principle and method PD pattern recognition with fractal to profile of PD distribution

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): Xin Li ; Caixin Sun ; Jian Li ; Ruijin Liao ; Quan Zhou
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 3
Page(s): 127 - 129
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973583

This paper adopts two kinds of fractal analysis to profile partial discharge (PD) distribution. The analysis results show that fractal dimension can be effectively used as a new feature in PD... View More