IEEE - Institute of Electrical and Electronics Engineers, Inc. - Electrostatic interfacial phenomena and I-V characteristics of Au/polyimide Langmuir-Blodgett film/Al element

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): C.Q. Li ; Y. Noguchi ; T. Manaka ; H.C. Wu ; M. Iwamoto
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 4
Page(s): 75 - 78
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973567
Regular:

In this paper, we have analyzed the I-V characteristic of metal (Au)-PI LB film-metal (Al) elements, taking into account the interfacial electrostatic phenomena and the existence of the... View More

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