IEEE - Institute of Electrical and Electronics Engineers, Inc. - Time-lag measurement of void discharges and numerical simulation for clarification of the factor for partial discharge pattern

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): N. Hozumi ; H. Nagae ; Y. Muramoto ; M. Nagao ; HengKyun Xie
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 4
Page(s): 29 - 32
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973549

Partial discharge pattern has often been applied for diagnosing high voltage equipment. The pattern indicates the relation between the phase angle of applied voltage and the parameters such as... View More