IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced PD noise suppression and its relevance for computer aided PD defect identification

Proceedings of 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001) 2001 Asia Conference on Electrical Insulation Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Electronic Insulating Materials and Applications in Systems

Author(s): H.-G. Kranz
Sponsor(s): IEEJ Tech. Committee on Dielectrics and Electr. Insulation Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Himeji, Japan, Japan
Conference Date: 22 November 2001
Page Count: 9
Page(s): 11 - 19
ISBN (Paper): 4-88686-053-2
DOI: 10.1109/ISEIM.2001.973545
Regular:

Digital partial discharge (PD) defect identification has become state of the art. But computer aided procedures based on pattern recognition principles are negatively effected by pulse-shaped... View More

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