IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approach to LEM modeling: construction, collision detection and dynamic simulation

Proceedings of RSJ/IEEE International Conference on Intelligent Robots and Systems

Author(s): K. Sundaraj ; C. Laugier ; I.F. Costa
Sponsor(s): IEEE Ind. Electron. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Maui, HI, USA, USA
Conference Date: 29 October 2001
Volume: 4
Page Count: 6
ISBN (Paper): 0-7803-6612-3
DOI: 10.1109/IROS.2001.976396
Regular:

This paper presents an approach to apply the long element method (LEM), a new method for physically based simulation of deformable objects, to a general polygonal mesh. The LEM is suitable for... View More

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