IEEE - Institute of Electrical and Electronics Engineers, Inc. - Localization in changing environments - estimation of a covariance matrix for the IDC algorithm

Proceedings of RSJ/IEEE International Conference on Intelligent Robots and Systems

Author(s): O. Bengtsson ; A.J. Baerveldt
Sponsor(s): IEEE Ind. Electron. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Maui, HI, USA, USA
Conference Date: 29 October 2001
Volume: 4
Page Count: 7
ISBN (Paper): 0-7803-6612-3
DOI: 10.1109/IROS.2001.976356
Regular:

We (1999) have previously presented a new scan-matching algorithm based on the iterative dual correspondence (IDC) algorithm, which showed a good localization performance even in the case of... View More

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