IEEE - Institute of Electrical and Electronics Engineers, Inc. - An approach to optimally robust fault detection and diagnosis

Proceedings of the 2001 IEEE International Conference on Control Applications (CCA'01)

Author(s): M. Nazih ; V. Michel
Sponsor(s): IEEE Control Syst. Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Mexico City, Mexico, Mexico
Conference Date: 7 September 2001
Page Count: 7
Page(s): 94 - 100
ISBN (Paper): 0-7803-6733-2
DOI: 10.1109/CCA.2001.973844
Regular:

In this paper, an original approach for robust fault detection and diagnosis (RFDD) is presented. We propose a method that makes use of H/sub 2/ and H/sub /spl infin// polynomial estimators to... View More

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