IEEE - Institute of Electrical and Electronics Engineers, Inc. - RTL functional verification using excitation and observation coverage

Proceedings Sixth IEEE International High-Level Design Validation and Test Workshop

Author(s): B. Min ; G. Choi
Sponsor(s): IEEE Comput. Soc. Tech. Council on Test Technol. IEEE Comput. Soc. Tech. Committee on Design Autom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Monterey, CA, USA, USA
Conference Date: 9 November 2001
Page Count: 6
Page(s): 58 - 63
ISBN (Paper): 0-7695-1411-1
DOI: 10.1109/HLDVT.2001.972808
Regular:

Code-level coverage is often used to measure RTL-level verification progress. However, a simple code-level coverage inaccurately estimates the verification result by considering only the... View More

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