IEEE - Institute of Electrical and Electronics Engineers, Inc. - A graphical class representation for integrated black- and white-box testing

Proceedings IEEE International Conference on Software Maintenance. ICSM 2001

Author(s): S. Beydeda ; V. Gruh ; M. Stachorski
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Florence, Italy, Italy
Conference Date: 7 November 2001
Page Count: 10
Page(s): 706 - 715
ISBN (Paper): 0-7695-1189-9
ISSN (Paper): 1063-6773
DOI: 10.1109/ICSM.2001.972789
Regular:

Although both black- and white-box testing have the same objective, namely detecting faults in a program, they are often conducted separately. In our opinion, the reason is the lack of techniques... View More

Advertisement