IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect prevention through defect prediction: a case study at Infosys

Proceedings IEEE International Conference on Software Maintenance. ICSM 2001

Author(s): S. Mohapatra ; B. Mohanty
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Florence, Italy, Italy
Conference Date: 7 November 2001
Page Count: 13
Page(s): 260 - 272
ISBN (Paper): 0-7695-1189-9
ISSN (Paper): 1063-6773
DOI: 10.1109/ICSM.2001.972739
Regular:

This paper is an experience report of a software process model which will help in preventing defects through defect prediction. The paper gives a vivid description of how the model aligns itself... View More

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