IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-view architecture trend analysis for medical imaging

Proceedings IEEE International Conference on Software Maintenance. ICSM 2001

Author(s): T. Rotschke ; R. Krikhaar ; D. Havenith
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Florence, Italy, Italy
Conference Date: 7 November 2001
Page Count: 1
ISBN (Paper): 0-7695-1189-9
ISSN (Paper): 1063-6773
DOI: 10.1109/ICSM.2001.972719
Regular:

We show how two web-based architecture trend analysis tools, considering different views and their changes over time, contribute to our daily effort to cope with the complexity of a large,... View More

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