IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new algorithm for flaw simulation in castings by superimposing projections of 3D models onto X-ray images

SCCC 2001. 21st International Conference of the Chilean Computer Science Society

Author(s): D. Mery
Sponsor(s): ATI (Informatics Professional Association,Spain)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Punta Arenas, Chile, Chile
Conference Date: 9 November 2001
Page Count: 10
Page(s): 193 - 202
ISBN (Paper): 0-7695-1396-4
ISSN (Paper): 1522-4902
DOI: 10.1109/SCCC.2001.972648
Regular:

In order to evaluate the sensitivity of defect inspection systems, it is convenient to examine simulated data. This gives the possibility to tune the parameters of the inspection method and to... View More

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