IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combined use of intelligent partial discharge analysis in evaluating high voltage dielectric condition

2001 IEEE/PES Transmission and Distribution Conference and Exposition

Author(s): N.B. Bish ; P.A. Howson ; R.J. Howlett ; T.J. Fawcett ; D.A. Hilder
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2001
Conference Location: Atlanta, GA, USA, USA
Conference Date: 2 November 2001
Volume: 2
Page Count: 5
ISBN (Paper): 0-7803-7285-9
DOI: 10.1109/TDC.2001.971345
Regular:

This paper describes the results of synthesised high voltage impulse tests, conducted on surrogate dielectric samples. The tests conducted under laboratory conditions, were performed using... View More

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